實驗名稱：表面電位衰減(jian)理論(lun)與測試系(xi)統

　　測試目的：表(biao)(biao)面電(dian)(dian)位(wei)衰減(jian)是(shi)通過(guo)(guo)電(dian)(dian)暈(yun)放電(dian)(dian)給絕緣材料(liao)表(biao)(biao)面進行充電(dian)(dian)，充電(dian)(dian)過(guo)(guo)程中(zhong)(zhong)電(dian)(dian)暈(yun)中(zhong)(zhong)的(de)電(dian)(dian)荷會進入材料(liao)內部。基于陷(xian)阱(jing)理論，這些空(kong)間電(dian)(dian)荷會被材料(liao)內部的(de)陷(xian)阱(jing)所捕獲(huo)形成表(biao)(biao)面電(dian)(dian)位(wei)。材料(liao)另一面與地(di)電(dian)(dian)極相連，在撤(che)去外加(jia)電(dian)(dian)壓(ya)后電(dian)(dian)荷逐(zhu)漸脫陷(xian)從而形成電(dian)(dian)位(wei)衰減(jian)過(guo)(guo)程。電(dian)(dian)位(wei)的(de)衰減(jian)主要是(shi)由于充電(dian)(dian)過(guo)(guo)程中(zhong)(zhong)的(de)入陷(xian)電(dian)(dian)荷通過(guo)(guo)電(dian)(dian)荷輸運流入地(di)電(dian)(dian)極形成的(de)。

　　測試設備：高壓放大器、高壓(ya)直流電(dian)源(yuan)、信號發生器、高壓(ya)探(tan)頭、高速高壓(ya)靜電(dian)電(dian)壓(ya)表(biao)和(he)計(ji)算機等。

　　實驗過程：

　　圖1：表面電位衰(shuai)減測試系(xi)統

　　基于(yu)以上理論搭建了表面(mian)電(dian)(dian)位衰減測(ce)試系(xi)統，如圖1所示。從圖中可知(zhi)，該測(ce)試系(xi)統主(zhu)要由加(jia)壓(ya)(ya)(ya)(ya)模(mo)(mo)塊(kuai)(kuai)、測(ce)量模(mo)(mo)塊(kuai)(kuai)、溫控(kong)模(mo)(mo)塊(kuai)(kuai)、傳動模(mo)(mo)塊(kuai)(kuai)和(he)(he)采集(ji)模(mo)(mo)塊(kuai)(kuai)等組(zu)成(cheng)。加(jia)壓(ya)(ya)(ya)(ya)模(mo)(mo)塊(kuai)(kuai)包括高(gao)(gao)壓(ya)(ya)(ya)(ya)直流電(dian)(dian)源(yuan)、高(gao)(gao)壓(ya)(ya)(ya)(ya)放大器(qi)、信號發生器(qi)；電(dian)(dian)極(ji)(ji)(ji)模(mo)(mo)塊(kuai)(kuai)包括與高(gao)(gao)壓(ya)(ya)(ya)(ya)放大器(qi)相(xiang)(xiang)連(lian)(lian)的(de)針電(dian)(dian)極(ji)(ji)(ji)、與高(gao)(gao)壓(ya)(ya)(ya)(ya)直流電(dian)(dian)源(yuan)相(xiang)(xiang)連(lian)(lian)的(de)均(jun)壓(ya)(ya)(ya)(ya)網（柵極(ji)(ji)(ji)）和(he)(he)試樣(yang)另一面(mian)相(xiang)(xiang)連(lian)(lian)的(de)地(di)電(dian)(dian)極(ji)(ji)(ji)；傳動模(mo)(mo)塊(kuai)(kuai)主(zhu)要是(shi)由與地(di)電(dian)(dian)極(ji)(ji)(ji)相(xiang)(xiang)連(lian)(lian)的(de)傳送軌道和(he)(he)控(kong)制(zhi)系(xi)統組(zu)成(cheng)，可以勻(yun)速地(di)將試樣(yang)送至高(gao)(gao)壓(ya)(ya)(ya)(ya)探(tan)頭(tou)下。溫控(kong)模(mo)(mo)塊(kuai)(kuai)主(zhu)要是(shi)由與地(di)電(dian)(dian)極(ji)(ji)(ji)相(xiang)(xiang)連(lian)(lian)的(de)加(jia)熱(re)帶和(he)(he)溫控(kong)系(xi)統組(zu)成(cheng)，以保證被(bei)測(ce)材料在不同恒(heng)溫下進行(xing)測(ce)量。采集(ji)模(mo)(mo)塊(kuai)(kuai)主(zhu)要包括高(gao)(gao)壓(ya)(ya)(ya)(ya)探(tan)頭(tou)、高(gao)(gao)速高(gao)(gao)壓(ya)(ya)(ya)(ya)靜電(dian)(dian)電(dian)(dian)壓(ya)(ya)(ya)(ya)表、DAQ和(he)(he)計算機(ji)。

　　測試(shi)過(guo)程如(ru)下(xia)(xia)：將試(shi)樣放置(zhi)在地電(dian)(dian)(dian)極(ji)上，保持(chi)均(jun)(jun)壓(ya)(ya)(ya)網(wang)到試(shi)樣表面以及(ji)均(jun)(jun)壓(ya)(ya)(ya)網(wang)到針電(dian)(dian)(dian)極(ji)的(de)(de)距離均(jun)(jun)為(wei)(wei)(wei)5mm。調整所需(xu)要的(de)(de)測量溫度，等溫度穩定后開始加(jia)壓(ya)(ya)(ya)，對針電(dian)(dian)(dian)極(ji)施加(jia)直流(liu)電(dian)(dian)(dian)壓(ya)(ya)(ya)為(wei)(wei)(wei)-8kV，均(jun)(jun)壓(ya)(ya)(ya)網(wang)上的(de)(de)電(dian)(dian)(dian)壓(ya)(ya)(ya)為(wei)(wei)(wei)-4kV。均(jun)(jun)壓(ya)(ya)(ya)網(wang)的(de)(de)作用是使電(dian)(dian)(dian)暈產生的(de)(de)電(dian)(dian)(dian)場均(jun)(jun)勻地作用在試(shi)樣的(de)(de)表面，且作為(wei)(wei)(wei)電(dian)(dian)(dian)壓(ya)(ya)(ya)衰減的(de)(de)鉗(qian)位電(dian)(dian)(dian)壓(ya)(ya)(ya)。電(dian)(dian)(dian)暈充電(dian)(dian)(dian)時間為(wei)(wei)(wei)3min。充電(dian)(dian)(dian)結束后通(tong)(tong)(tong)過(guo)傳送軌道(dao)將試(shi)樣迅(xun)速(su)(su)勻速(su)(su)移動到探(tan)頭下(xia)(xia)，表面電(dian)(dian)(dian)位數值通(tong)(tong)(tong)過(guo)高(gao)速(su)(su)高(gao)壓(ya)(ya)(ya)靜電(dian)(dian)(dian)電(dian)(dian)(dian)壓(ya)(ya)(ya)表顯示，最后通(tong)(tong)(tong)過(guo)DAQ和計算機的(de)(de)LabVIEW程序進(jin)行采集(ji)，采集(ji)時間為(wei)(wei)(wei)40min。實驗過(guo)程中的(de)(de)濕度控制(zhi)在30%以下(xia)(xia)。

　　實驗結果：

　　搭建(jian)實驗裝(zhuang)置，介(jie)紹了表面電(dian)位衰(shuai)減理論并(bing)搭建(jian)了不同溫度表面電(dian)位衰(shuai)減測量裝(zhuang)置以及實驗條(tiao)件(jian)。

　　高壓放大器推薦(jian)：ATA-67100

　　圖(tu)：ATA-67100高壓(ya)放(fang)大器(qi)指標(biao)參數

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